1 Introduction
The dielectric constant is a fundamental physical property that reflects the ability of a material to store electrical energy in an electric field. It plays a crucial role in various scientific and engineering applications, including electromagnetic compatibility, biomedical research, microwave technology, electronics, food processing, and geological exploration. Accurate measurement of the dielectric constant is essential for understanding and optimizing the performance of materials in these fields. Today, dielectric constant measurement techniques are widely used across civil, industrial, and defense sectors, demonstrating their broad applicability and significance. In the food industry, dielectric constant measurements are extensively applied in storage, processing, sterilization, grading, and quality inspection. By measuring the dielectric constant, key parameters such as water content, freshness, and the progress of fermentation or drying can be indirectly assessed. Additionally, process parameters like sterilization time and power density are often determined based on the dielectric properties of the food. This technique has become an important tool in food science and technology [1]. In civil engineering, particularly in subgrade compaction testing, traditional methods are labor-intensive, time-consuming, and sometimes destructive to the road surface. However, dielectric constant measurement offers a non-invasive alternative. Since soil moisture, temperature, and density affect its dielectric properties, radar-based techniques can be used to measure the dielectric constant over large areas. This helps determine the subgrade density and compaction level efficiently. Similarly, complex permittivity measurement has been applied in monitoring soil and water pollution and even in predicting earthquakes by analyzing rock dielectric constants [2-4]. In the industrial sector, dielectric constant measurement techniques have found significant applications. For example, low dielectric constant materials are used in very large scale integrated circuits (VLSI) to reduce parasitic capacitance and improve performance. High dielectric constant materials are vital in semiconductor memory devices, enabling the development of advanced electronic components with enhanced functionality [5-6]. In military applications, dielectric constant measurement is widely used in radar systems and special material testing. The importance of dielectric constant measurement continues to grow as new technologies emerge. While existing standards provide reliable methods for measuring dielectric constants, there remains room for improvement and innovation. By summarizing and analyzing current measurement techniques, we can better understand their strengths and limitations, and identify methods that may be more suitable for specific applications. This not only enhances theoretical knowledge but also supports practical engineering solutions. 2. Overview of Dielectric Constant Measurement Methods Dielectric constant measurement methods vary depending on the type of material being tested. They can be categorized into solid, liquid, gas, and powder (particle) measurement techniques [7]. Among these, solid dielectrics are the most commonly measured, and they can be further divided into fixed-shape solids and irregular-shaped solids. Liquid and gas measurement methods are less common compared to solid samples. For liquids, the waveguide reflection method is often used, with an error margin of approximately 5% [8]. National standards also provide guidelines for measuring the loss tangent and dielectric constant of liquids at 90°C and power frequency [9]. Gas measurement methods are limited in number and generally offer lower accuracy. One approach involves measuring the resonance frequency in an LC series resonant circuit, using a digital frequency meter to record changes under varying pressure conditions [10]. Table 1 outlines the national standard methods for measuring the dielectric constant of solids, along with their frequency ranges, dielectric constant limits, and other relevant specifications.Method | Frequency Range | Dielectric Constant Range | Material Type |
---|---|---|---|
Perturbation Method | Below 50 MHz | 2–100 | Solids |
Open Cavity Method | 100 MHz–30 GHz | 2–100 | Solids |
Waveguide Method | 1–10 GHz | 2–100 | Solids |
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